Demonstration of relaxed InGaN-based red LEDs grown with high active region temperature

被引:43
作者
Chan, Philip [1 ]
Rienzi, Vincent [2 ]
Lim, Norleakvisoth [3 ]
Chang, Hsun-Ming [1 ]
Gordon, Michael [3 ]
DenBaars, Steven P. [1 ,2 ]
Nakamura, Shuji [1 ,2 ]
机构
[1] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
[2] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
[3] Univ Calif Santa Barbara, Dept Chem Engn, Santa Barbara, CA 93106 USA
基金
美国国家科学基金会;
关键词
MOCVD; Nitrides; InGaN; Relaxation; Relaxed InGaN; LIGHT-EMITTING-DIODES; EMISSION;
D O I
10.35848/1882-0786/ac251d
中图分类号
O59 [应用物理学];
学科分类号
摘要
Red LEDs were grown by metalorganic chemical vapor deposition with a high active region temperature of 870 degrees C on a relaxed InGaN/GaN superlattice buffer. The buffer was 100% biaxially relaxed by the thermal decomposition of an InGaN underlayer, measured by high resolution X-ray diffraction. Fabricated LEDs showed a low forward voltage of 2.25 V at a current density of 25 Acm(-2) with no Al-containing layers in the active region, a peak emission wavelength of 633 nm at 200 Acm(-2) and an on-wafer peak external quantum efficiency of 0.05%. Uniform red emission and relaxation were observed across a two inch substrate.
引用
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页数:4
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