High resolution x-ray micromachining using SU-8 resist

被引:12
|
作者
Shew, BY
Hung, JT
Huang, TY
Liu, KP
Chou, CP
机构
[1] Natl Synchrotron Radiat Res Ctr, Microstruct Grp, Hsinchu 30077, Taiwan
[2] Yuan Ze Univ, Dept Mech Engn, Chungli, Taiwan
[3] Natl Chiao Tung Univ, Dept Mech Engn, Hsinchu, Taiwan
关键词
D O I
10.1088/0960-1317/13/5/324
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper investigates the feasibility of using SU-8 as a high contrast x-ray resist. The SU-8 resist was irradiated with various x-ray doses and then developed for a fixed time. The developing rate was then measured and plotted versus absorbed x-ray dosage. The results revealed that SU-8 exhibited very high lithographic contrast other than elevated sensitivity. Therefore, a very thin mask absorber is required to switch the negative resist 'ON' or 'OFF'. Preliminary results showed that 1 mum wide, 17 mum thick SU-8 resists could be successfully patterned using an absorber of submicron thickness. Once the absorber thickness is effectively reduced to less than 1 mum, a high-resolution x-ray mask can be patterned simply by conventional UV lithography. An extra soft x-ray beamline was not required to increase the absorber's thickness in certain cases. The process of fabricating the membrane x-ray mask could thus be considerably simplified. X-ray micromachining may be an easy way to pattern high-resolution and high-aspect-ratio microstructures for optical and photonic applications.
引用
收藏
页码:708 / 713
页数:6
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