The influence of substrate polarity on the structural quality of InN layers grown by high-pressure chemical vapor deposition

被引:15
作者
Dietz, N. [1 ]
Alevli, M. [1 ]
Atalay, R. [1 ]
Durkaya, G. [1 ]
Collazo, R. [2 ]
Tweedie, J. [2 ]
Mita, S. [2 ]
Sitar, Z. [2 ]
机构
[1] Georgia State Univ, Dept Phys & Astron, Atlanta, GA 30302 USA
[2] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
关键词
D O I
10.1063/1.2840192
中图分类号
O59 [应用物理学];
学科分类号
摘要
The influence of substrate polarity on the properties of InN layers grown by high-pressure chemical vapor deposition has been studied. The 2 Theta-omega x-ray diffraction scans on InN layers deposited on polar GaN epilayers revealed single-phase InN(0002) with a full width at half maximum (FWHM) of around 200 arc sec. InN layers grown on N-polar GaN exhibit larger FWHMs. Rocking curve analysis confirmed single-phase InN for both growth polarities, with FWHM values for omega-RC(002) at 2080 arc sec for InN grown on Ga-polar templates. The A(1)(LO) Raman mode analysis shows higher free carrier concentrations in InN grown on N-polar templates, indicating that polarity affects the incorporation of impurities. (c) 2008 American Institute of Physics.
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页数:3
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