Simultaneous measurement of soft error rate of 90 nm CMOS SRAM and cosmic ray neutron spectra at the summit of Mauna Kea

被引：0
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作者：
Tosaka, Yoshiharu [1 ]
Takasu, Ryozo [1 ]
Uemura, Taiki [1 ]
Ehara, Hideo [2 ]
Matsuyama, Hideya [2 ]
Satoh, Shigeo [1 ]
Kawai, Atsushi [3 ]
Hayashi, Masahiko [3 ]
机构：
[1] Fujitsu Labs Ltd, 50 Fuchigami, Tokyo 1970833, Japan
[2] Fujitsu Ltd, Tokyo, Japan
[3] Natl Astron Observ Japan, Subaru Telescope, Tokyo, Japan
来源：
2008 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 46TH ANNUAL | 2008年
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：727 / +
页数：2
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