Applications of synchrotron-based X-ray microprobes

被引:125
作者
Bertsch, PM [1 ]
Hunter, DB [1 ]
机构
[1] Univ Georgia, Savannah River Ecol Lab, Adv Analyt Ctr Environm Sci, Aiken, SC 29802 USA
关键词
D O I
10.1021/cr990070s
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Applications of synchrotron-based X-ray microprobes were discussed. The complementary spatially resolved X-ray fluorescence spectroscopy (SXRF) and X-ray absorption fine structure spectroscopy (XAFS) techniques as well as X-ray microscopy were also studied. The results suggest that these methods can become mainstream analytical, imaging, and spectroscopic tools in a number of scientific fields over the next decade.
引用
收藏
页码:1809 / 1842
页数:34
相关论文
共 317 条
[1]  
ABRAHAMPESKIR JV, 1999, 6 INT C XRAY MICR BE, P113
[2]   X-ray spectromicroscopy of polymers and tribological surfaces at beamline X1A at the NSLS [J].
Ade, H ;
Smith, AP ;
Zhang, H ;
Zhuang, GR ;
Kirz, J ;
Rightor, E ;
Hitchcock, A .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1997, 84 (1-3) :53-71
[3]   Bulk and surface characterization of a dewetting thin film polymer bilayer [J].
Ade, H ;
Winesett, DA ;
Smith, AP ;
Anders, S ;
Stammler, T ;
Heske, C ;
Slep, D ;
Rafailovich, MH ;
Sokolov, J ;
Stöhr, J .
APPLIED PHYSICS LETTERS, 1998, 73 (25) :3775-3777
[4]   Phase segregation in polymer thin films: Elucidations by X-ray and scanning force microscopy [J].
Ade, H ;
Winesett, DA ;
Smith, AP ;
Qu, S ;
Ge, S ;
Sokolov, J ;
Rafailovich, M .
EUROPHYSICS LETTERS, 1999, 45 (04) :526-532
[5]  
Ade H, 1997, TRENDS POLYM SCI, V5, P58
[6]   X-RAY MICROSCOPY IN POLYMER SCIENCE - PROSPECTS OF A NEW IMAGING TECHNIQUE [J].
ADE, H ;
SMITH, AP ;
CAMERON, S ;
CIESLINSKI, R ;
MITCHELL, G ;
HSIAO, B ;
RIGHTOR, E .
POLYMER, 1995, 36 (09) :1843-1848
[7]   CHEMICAL CONTRAST IN X-RAY MICROSCOPY AND SPATIALLY RESOLVED XANES SPECTROSCOPY OF ORGANIC SPECIMENS [J].
ADE, H ;
ZHANG, X ;
CAMERON, S ;
COSTELLO, C ;
KIRZ, J ;
WILLIAMS, S .
SCIENCE, 1992, 258 (5084) :972-975
[8]   X-RAY SPECTROMICROSCOPY WITH A ZONE PLATE GENERATED MICROPROBE [J].
ADE, H ;
KIRZ, J ;
HULBERT, SL ;
JOHNSON, ED ;
ANDERSON, E ;
KERN, D .
APPLIED PHYSICS LETTERS, 1990, 56 (19) :1841-1844
[9]   IMPROVED IMAGES WITH THE SCANNING PHOTOELECTRON MICROSCOPE AT THE NATIONAL SYNCHROTRON LIGHT-SOURCE [J].
ADE, H ;
KO, CH ;
JOHNSON, ED ;
ANDERSON, E .
SURFACE AND INTERFACE ANALYSIS, 1992, 19 (1-12) :17-22
[10]  
ADE H, 1999, 6 INT C XRAY MICR BE, P197