A new method for determining small misorientations from electron back scatter diffraction patterns

被引：119
作者：
Wilkinson, AJ [1 ]
机构：
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
来源：
SCRIPTA MATERIALIA | 2001年 / 44卷 / 10期
关键词：
EBSD; SEM; misorientation; electron microscopy; dislocation cells;
D O I：
10.1016/S1359-6462(01)00943-5
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Electron back scatter diffraction (EBSD) was used to measure the local small misorientations due to the accumulation of dislocations within crystals. A new analysis method is presented in which misorientations are measured directly by using cross-correlation methods to determine the relative positions of identical features in pairs of EBSD patterns. Repeated measurements from Si singles crystals showed that the standard deviation in measured misorientation angles was reduced to ∼0.01° from ∼0.2° using the conventional analysis. The misorientation axes can be determined with the little error (∼2°) provided the misorientations angles are greater than ∼0.5°.
引用
收藏
页码：2379 / 2385
页数：7
相关论文
共 14 条
[1]   OVERVIEW NO-96 - EVOLUTION OF FCC DEFORMATION STRUCTURES IN POLYSLIP [J].
BAY, B ;
HANSEN, N ;
HUGHES, DA ;
KUHLMANNWILSDORF, D .
ACTA METALLURGICA ET MATERIALIA, 1992, 40 (02) :205-219
[2]   MICROTEXTURE DETERMINATION BY ELECTRON BACK-SCATTER DIFFRACTION [J].
DINGLEY, DJ ;
RANDLE, V .
JOURNAL OF MATERIALS SCIENCE, 1992, 27 (17) :4545-4566
[3]   Scaling of the spacing of deformation induced dislocation boundaries [J].
Godfrey, A ;
Hughes, DA .
ACTA MATERIALIA, 2000, 48 (08) :1897-1905
[4]   Slip pattern, microstructure and local crystallography in an aluminium single crystal of copper orientation {112}⟨111⟩ [J].
Godfrey, A ;
Jensen, DJ ;
Hansen, N .
ACTA MATERIALIA, 1998, 46 (03) :835-848
[5]   Scaling of microstructural parameters: Misorientations of deformation induced boundaries [J].
Hughes, DA ;
Liu, Q ;
Chrzan, DC ;
Hansen, N .
ACTA MATERIALIA, 1997, 45 (01) :105-112
[6]  
Humphreys FJ, 1999, J MICROSC-OXFORD, V195, P6
[7]  
Humphreys FJ, 1999, J MICROSC-OXFORD, V195, P170, DOI 10.1046/j.1365-2818.1999.00578.x
[8]  
JUULJENSEN D, IN PRESS MAT SCI TEC
[9]  
LASSEN NCK, 1992, SCANNING MICROSCOPY, V6, P115
[10]   Heterogeneous microstructures and microtextures in cube-oriented Al crystals after channel die compression [J].
Liu, Q ;
Maurice, C ;
Driver, J ;
Hansen, N .
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1998, 29 (09) :2333-2344
12