Crystallographic orientation of modulated martensite in epitaxially grown Ni-Mn-Ga thin film

被引：4

作者：

Yang, Bo ^{[1
,2
,3
]}

Zhang, Yudong ^{[2
,3
]}

Li, Zongbin ^{[1
,2
,3
]}

Qin, Gaowu ^{[1
]}

Esling, Claude ^{[2
,3
]}

Zhao, Xiang ^{[1
]}

Zuo, Liang ^{[1
]}

机构：

[1] Northeastern Univ, Key Lab Anisotropy & Texture Mat, Minist Educ, Shenyang 110819, Peoples R China

[2] Univ Lorraine, LEM3, CNRS UMR 7239, F-57045 Metz, France

[3] Univ Lorraine, Lab Excellence Design Alloy Met Low MAss Struct D, F-57045 Metz, France

来源：

THIN SOLID FILMS | 2015年 / 584卷

关键词：

Nickel-magnesium-gallium alloy; Thin films; Texture; Crystallographic orientation; Twins; Twin interface; SHAPE-MEMORY ALLOY; FIELD-INDUCED STRAIN; TRANSFORMATION; PHASE;

D O I：

10.1016/j.tsf.2014.11.073

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this work, local crystallographic orientation of seven-layer modulated (7M) martensite correlated with microstructure in Ni-Mn-Ga thin films was revealed by electron backscatter diffraction. The microstructure of 7M martensite can be classified into two distinct groups, i.e. the low and high relative contrast zones. There are four crystallographically orientated martensite plates in each variant group. Each martensite plate is composed of one 7M martensite variant. In the low relative contrast zone, all the four variants are with their (2 0 20)(mono) plane nearly parallel to the substrate surface. In the high relative contrast zone, there are two variants with their (2 0 (20) over bar)(mono) plane nearly parallel to the substrate surface and two variants with their (0 4 0)(mono) plane nearly parallel to the substrate surface. Crystallographic calculation indicates that the four 7M martensite variants are twin related. (C) 2014 Elsevier B.V. All rights reserved.

引用

页码：90 / 93

页数：4

共 27 条

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