Charge trapping process of nonvolatile memory devices based on CdTe and CdTe-CdSe core-shell nanoparticles/poly(methylmethacrylate) nanocomposites

被引:13
|
作者
Yun, Dong Yeol [1 ]
Son, Jung Min [2 ]
Kim, Tae Whan [1 ,2 ]
Kim, Sung Woo [3 ]
Kim, Sang Wook [3 ]
机构
[1] Hanyang Univ, Div Nanoscale Semicond Engn, Seoul 133791, South Korea
[2] Hanyang Univ, Dept Elect & Comp Engn, Seoul 133791, South Korea
[3] Ajou Univ, Dept Mol Sci & Technol, Suwon 443749, South Korea
关键词
QUANTUM DOTS; NANOCRYSTALS; ELEMENTS; LAYER;
D O I
10.1063/1.3596705
中图分类号
O59 [应用物理学];
学科分类号
摘要
Nonvolatile memory devices based on CdTe and CdTe-CdSe core-shell nanoparticles embedded in a poly(methylmethacrylate) (PMMA) layer were fabricated to investigate the variation in the carrier transport mechanisms due to a CdSe shell. Capacitance-voltage (C-V) curves for Al/CdTe nanoparticles embedded in PMMA/p-Si and Al/CdTe-CdSe nanoparticles embedded in PMMA/p-Si devices at 300 K showed that the flatband voltage shift of the C-V curve for the device with the CdTe-CdSe nanoparticles was relatively smaller than that for the device with the CdTe nanoparticle. Carrier transport mechanisms of the memory devices are described by using the C-V results, energy band diagrams, and capacitance-time retentions. (C) 2011 American Institute of Physics. [doi:10.1063/1.3596705]
引用
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页数:3
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