Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry

被引：43

作者：

Ruiz, PD ^{[1
]}

Huntley, JM ^{[1
]}

Wildman, RD ^{[1
]}

机构：

[1] Univ Loughborough, Wolfson Sch Mech & Mfg Engn, Loughborough LE11 3TU, Leics, England

来源：

APPLIED OPTICS | 2005年 / 44卷 / 19期

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1364/AO.44.003945

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We show, for the first time to our knowledge, how wavelength-scanning interferometry can be used to measure depth-resolved displacement fields through semitransparent scattering surfaces. Temporal sequences of speckle interferograms are recorded while the wavelength of the laser is tuned at a constant rate. Fourier transformation of the resultant three-dimensional (3-D) intensity distribution along the time axis reconstructs the scattering potential within the medium, and changes in the 3-D phase distribution measured between two separate scans provide the out-of-plane component of the 3-D displacement field. The principle of the technique is explained in detail and illustrated with a proof-of-principle experiment involving two independently tilted semitransparent scattering surfaces. Results are validated by standard two-beam electronic speckle pattern interferometry. (c) 2005 Optical Society of America.

引用

页码：3945 / 3953

页数：9

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