Substrate effect on doping and degradation of graphene

被引:10
|
作者
Ji, Eunji [1 ]
Kim, Min Jung [1 ]
Lee, Jong-Young [2 ]
Sung, Dongchul [4 ,5 ,6 ]
Kim, Namwon [3 ,7 ]
Park, Jin-Woo [1 ]
Hong, Suklyun [4 ,5 ]
Lee, Gwan-Hyoung [2 ,3 ,8 ,9 ]
机构
[1] Yonsei Univ, Dept Mat Sci & Engn, Seoul 03722, South Korea
[2] Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 08826, South Korea
[3] Seoul Natl Univ, Res Inst Adv Mat RIAM, Seoul 08826, South Korea
[4] Sejong Univ, Graphene Res Inst, Dept Phys, Seoul 05006, South Korea
[5] Sejong Univ, GRI TPC Int Res Ctr, Seoul 05006, South Korea
[6] Sungkyunkwan Univ, Dept Chem, Suwon 16419, South Korea
[7] Texas State Univ, Ingram Sch Engn, San Marcos, TX 78666 USA
[8] Seoul Natl Univ, Inst Engn Res, Seoul 08826, South Korea
[9] Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea
基金
新加坡国家研究基金会;
关键词
Graphene; Silicon dioxide; Doping; Degradation; Substrate effect; RAMAN-SPECTROSCOPY; ELECTRONIC-PROPERTIES; PLASMA TREATMENT; OXYGEN-PLASMA; SINGLE-LAYER; TOTAL-ENERGY; REACTIVITY; SCATTERING; INTERFACE; MOLECULES;
D O I
10.1016/j.carbon.2021.08.048
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Graphene is influenced by its surrounding environment, such as adsorbates, charged impurities, and interface traps, owing to its large surface area and ultra-thin thickness. Herein, the effect of substrate conditions on the doping and degradation of graphene is investigated. The hydroxyl (-OH) groups on the silicon dioxide (SiO2) substrate formed by oxygen plasma treatment altered the characteristics of the overlying graphene. On exposure to ultraviolet (UV) light, the p-doping level of graphene on oxygen-plasma-treated SiO2 (P-SiO2) increased and degradation occurred, while graphene on bare SiO2 showed no change. The graphene on P-SiO2 had higher reactivity due to doping induced by -OH groups on the SiO2 surface. The graphene field-effect transistors (G-FETs) on the P-SiO2 also showed the reduced carrier mobility and larger shift of charge neutral point. However, during UV exposure, the device showed sever degradation in electrical conductivity and failure after 60 min. Meanwhile, the device on the bare SiO2 showed negligible changes even after UV exposure. Our results unveil the origin of degradation in the graphene and show a way to prevent the unwanted changes or degradation of graphene, which is highly important for the practical application of graphene. (C) 2021 Elsevier Ltd. All rights reserved.
引用
收藏
页码:651 / 658
页数:8
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