Uncertainty budget for the NIST electron counting capacitance standard, ECCS-1

被引：37

作者：

Keller, Mark W. ^{[1
]}

Zimmerman, Neil M. ^{[2
]}

Eichenberger, Ali L. ^{[1
]}

机构：

[1] NIST, Boulder, CO 80305 USA

[2] NIST, Gaithersburg, MD 20899 USA

来源：

METROLOGIA | 2007年 / 44卷 / 06期

关键词：

D O I：

10.1088/0026-1394/44/6/010

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We measure a cryogenic, vacuum-gap capacitor by two methods: (1) charging it with a known number of electrons and measuring the resulting voltage, and (2) using a capacitance bridge traceable to the SI farad. We report a detailed uncertainty budget for the comparison of the two methods and find that they agree within a relative standard uncertainty of 9.2 x 10(-7). This comparison closes the quantum metrology triangle with the same uncertainty.

引用

页码：505 / 512

页数：8

共 22 条

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