UNDERSTANDING THE EFFECT OF ELECTRODE CONFIGURATION ON INCIDENT ENERGY AND ARC-FLASH BOUNDARY

被引：0

作者：

Reeves, Adam ^{[1
]}

Freyenberger, Mark ^{[2
]}

Hodder, Michael ^{[3
]}

机构：

[1] Eaton, 7451 Coca Cola Dr, Hanover, MD 21076 USA

[2] Eaton, 50 Soccer Pk Dr, Fenton, MO 63026 USA

[3] Eaton, 610 Ind Dr,Unit 2, Milton, ON L9T 5C3, Canada

来源：

2020 IEEE IAS ELECTRICAL SAFETY WORKSHOP (ESW) | 2020年

关键词：

Arcing fault current; arc flash; arc-flash boundary; arc-flash hazard analysis; electrode configuration; HCB; IEEE; 1584; incident energy; VCB; VCBB; working distance;

D O I：

10.1109/tia.2020.3023918

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The 2018 update to the IEEE Std. 1584 Guide for Performing Arc-Flash Hazard Calculations has introduced new electrode configurations that can drastically affect incident energy calculations and labeling. The electrode configurations discussed in this paper are: Vertical conductors/electrodes inside a metal box/enclosure (VCB), Vertical conductors/electrodes terminated in an insulating barrier inside a metal box/enclosure (VCBB) and Horizontal conductors/electrodes inside a metal box/enclosure (HCB). It is generally understood that at typical working distances, HCB will produce a higher incident energy than VCBB, which will produce a higher incident energy than VCB with all other parameters equal. However, there is a counter-intuitive trend for the arc-flash boundary, such that the boundary distance for HCB is often lower than the boundary for VCBB and VCB. The electrode configuration will also affect the magnitude of arcing current, which may result in varying fault clearing times depending on which electrode configuration is selected. This paper will discuss arcing fault current, incident energy, and arc-flash boundary results for each enclosed electrode configuration that challenge the assumption that HCB will always yield the worst-case incident energy and arc-flash boundary.

引用

页数：6