Identification of crosstalk switch failures in domino CMOS circuits

被引：21

作者：

Kundu, R ^{[1
]}

Blanton, RD ^{[1
]}

机构：

[1] Carnegie Mellon Univ, ECE Dept, Ctr Elect Design Automat, Pittsburgh, PA 15213 USA

来源：

INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS | 2000年

关键词：

D O I：

10.1109/TEST.2000.894243

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

Capacitative coupling will become a dominant problem due to increased parasitic capacitance between adjacent wires and faster signal switching rates. We coupling problem is mom acute for domino logic circuits since art irreversible gate output transition can result. We present a method to analyze domino circuits for susceptibility to crosstalk failures from a layout-extracted netlist. Specifically, sites in the circuit that may fail due to crosstalk am identified. In addition, failure sites are partitioned into two categories (faults or design errors) based on their likelihood of occurrence in the context of manufacturing variations. The method has been implemented and applied to a dual-rail domino Wallace tree circuit with little loss in accuracy, resulting in a 37X speedup over a full analysis using Hspice.

引用

页码：502 / 509

页数：8

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