Non-zero-crossing current-voltage hysteresis behavior in memristive system

被引:85
作者
Sun, B. [1 ,2 ]
Xiao, M. [1 ]
Zhou, G. [3 ,4 ]
Ren, Z. [4 ]
Zhou, Y. N. [1 ]
Wu, Y. A. [1 ]
机构
[1] Univ Waterloo, Ctr Adv Mat Joining, Waterloo Inst Nano Technol, Dept Mech & Mechatron Engn, Waterloo, ON N2L 3G1, Canada
[2] Southwest Jiaotong Univ, Minist Educ China, Sch Phys Sci & Technol, Key Lab Adv Technol Mat, Chengdu 610031, Sichuan, Peoples R China
[3] Southwest Univ, Sch Artificial Intelligence, Chongqing 400715, Peoples R China
[4] Southwest Univ, ICEAM, Chongqing 400715, Peoples R China
基金
加拿大自然科学与工程研究理事会;
关键词
Current-voltage curves; Hysteresis behavior; Memristor; Capacitive; Ferroelectric; Internal electromotive force; RESISTIVE SWITCHING MEMORY; FERROELECTRIC POLARIZATION; DEVICE; PERFORMANCE; DIODE;
D O I
10.1016/j.mtadv.2020.100056
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Since the memristor was theoretically predicted at 1971, the research on memristor and memristive behavior has attracted great interest. However, there is a debate about the physical model of the non -zero-crossing (or named non-pinched) current-voltage (I-V) hysteresis behavior observed experimentally in many reported memristive devices. By identifying and analyzing all these non-zero-crossing hysteresis curves, we attribute this behavior to three mechanisms: the involvement of a capacitive effect, the appearance of a ferroelectric or piezoelectric polarization, and the formation of an internal electromotive force. Among them, the memristive behavior involving a capacitive effect has been reported extensively. It demonstrates that the combination of multiple physical properties (memristive and capacitive) in a single device could prefigure potential multifunctional applications. In this review, we discuss the physical mechanism of non-zero-crossing I-V curves, the related research progress with particular emphasis on the origin of non-zero-crossing I-V curves. Moreover, the existing problems in this field and the possible solutions will be discussed, providing an outlook for the future developments. (C) 2020 The Author(s). Published by Elsevier Ltd.
引用
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页数:11
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