A fuzzy model for path delay fault detection

被引：3

作者：

Favalli, M ^{[1
]}

机构：

[1] Univ Ferrara, DI, I-44100 Ferrara, Italy

来源：

IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 2005年 / 13卷 / 08期

关键词：

delay faults; fault simulation; fuzzy logic;

D O I：

10.1109/TVLSI.2005.853608

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A fuzzy model is proposed to analyze the effectiveness of test pairs targeting path delay faults. This model is accurate enough to rank nonrobust tests by accounting for conditions not considered in existing models. It remains fully consistent with the traditional test robustness analysis. Finally, it also provides a coverage metric to be used to rank whole test sets. The proposed model has been implemented in a logic level path delay fault simulator. Its accuracy has been validated, for a set of combinational benchmarks, by means of a Monte Carlo logic-level event-driven path delay fault simulator.

引用

页码：943 / 956

页数：14

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