An Application-Level Dependability Analysis Framework for Embedded Systems

被引：3

作者：

Bolchini, Cristiana ^{[1
]}

Miele, Antonio ^{[1
]}

机构：

[1] Politecn Milan, Dip Elettron & Informaz, I-20133 Milan, Italy

来源：

2011 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT) | 2011年

关键词：

FAULT INJECTION;

D O I：

10.1109/DFT.2011.25

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

This paper presents a framework for an in-depth analysis of transient faults in microprocessor-based embedded systems. The framework is based on a debug-like mechanism supporting an interpretation and analysis of the system behavior from an application point of view, in terms of function execution flow and passed/returned parameters. The framework offers a highly-customizable fault/error debug and classification approach, based on such application-level information, aimed at supporting the designer in the evaluation and tuning of the system dependability-related properties. We present an implementation of the proposed framework within a state-of-the-art fault injection environment for SystemC transaction-level multiprocessor specifications, and we show that the approach can be ported also in other environments. An experimental session considering an embedded system based on a processor highlights the benefits of the proposed approach.

引用

页码：171 / 178

页数：8

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