An overview of Pb-free, flip-chip wafer-bumping technologies

被引:16
|
作者
Kang, Sung K. [1 ]
Gruber, Peter [1 ]
Shih, Da-Yuan [1 ]
机构
[1] IBM TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
关键词
Solder Joint; Solder Alloy; Solder Bump; Ball Grid Array; Glass Mold;
D O I
10.1007/s11837-008-0075-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To meet the European Union Restriction of Hazardous Substances requirements and the continuing demand for lower costs, finer pitch, and high-reliability flip-chip packaging structures, considerable work is going on in the electronic industry to develop lead-free solutions for flip-chip technology. In this paper, various solder-bumping technologies developed for flip-chip applications are reviewed with an emphasis on a new wafer-bumping technology called C4NP (Controlled-Collapse-Chip-Connect New Process). Several inherent advantages of C4NP technology are discussed over other technologies. This paper will also discuss the recent development and implementation of lead-free C4 interconnections for 300 nun wafers demonstrated at IBM. In addition, some metallurgical considerations associated with C4NP technology are discussed.
引用
收藏
页码:66 / 70
页数:5
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