Reducing the interfacial defect density of CZTSSe solar cells by Mn substitution

被引:75
作者
Lie, Stener [1 ]
Tan, Joel Ming Rui [1 ]
Li, Wenjie [1 ]
Leow, Shin Woei [1 ]
Tay, Ying Fan [1 ]
Bishop, Douglas M. [2 ]
Gunawan, Oki [2 ]
Wong, Lydia Helena [1 ]
机构
[1] Nanyang Technol Univ, Sch Mat Sci & Engn, Singapore 639798, Singapore
[2] IBM TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
基金
新加坡国家研究基金会;
关键词
THIN-FILMS; GRAIN-BOUNDARIES; EFFICIENCY; CU2ZNSN(S; SE)(4); CU2ZNSNS4; FABRICATION; TRANSITION;
D O I
10.1039/c7ta09668b
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Cation disorder which arises from the size and chemical environment similarity of Cu and Zn is the limiting factor in Cu2ZnSnSxSe4- x (CZTSSe) performance. Cation substitution is one effective way to solve this issue, however, the most commonly reported substitutes, Ag and Cd, are not ideal as they detract from the earthabundant and non-toxic motivation of CZTSSe. Mn is a promising candidate in comparison with other candidates (e.g. Fe, Ni or Co), because of its oxidation state stability and larger ionic size mismatch with Cu. In this study, Cu2MnxZn1-xSn(S,Se)(4) (CMZTSSe) thin film solar cells were prepared by chemical spray pyrolysis and a subsequent selenization process. We study the influence of Mn substitution on the morphological, structural, optical, electrical and device properties. A distinct phase transformation from CZTSSe kesterite to C(M, Z) TSSe stannite is observed at 20% Mn substitution. A high amount of Mn substitution (x >= 0.6) is shown to increase the carrier density significantly which introduces more defects and non-radiative carrier recombination as shown by quenched photoluminescence intensity. Consequently, reduction in device performance is observed for these samples. The highest power conversion efficiency is achieved at x approximate to 0.05 with eta = 7.59%, V-oc = 0.43 V, J(sc) = 28.9 mA cm(-2) and FF = 61.03%. The improved open circuit voltage (Voc) and fill factor (FF) are attributed to the improved shunt resistance and carrier transport due to low defect density especially at the CdS/CMZTSSe interface. Finally, based on our electrical characterization, a few suggestions to improve the efficiency are proposed.
引用
收藏
页码:1540 / 1550
页数:11
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