A highly automated apparatus for ultra-fast laser ablation studies

被引:1
作者
Vreugdenhil, Marnix [1 ,2 ]
van Oosten, Dries [1 ,2 ]
机构
[1] Univ Utrecht, Debye Inst Nanomat Sci, 5, NL-3584 CC Utrecht, Netherlands
[2] Univ Utrecht, Ctr Extreme Matter & Emergent Phenomena, 5, NL-3584 CC Utrecht, Netherlands
基金
荷兰研究理事会;
关键词
FEMTOSECOND; THRESHOLDS; BREAKDOWN; SILICON;
D O I
10.1063/5.0095719
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present a novel experimental apparatus that can be used for extensive systematic studies of (single- and multi-shot) ultra-short laser pulse ablation. It is fully automated and generates a large number of ablation sites in a short time on a small sample surface area. For each site, the apparatus takes four in situ images: an image of the incident ablation beam (to determine pulse energy), a white light reference image of the pristine sample site, an image of the reflected ablation spot, and a white light image of the ablated sample site. The setup can perform ablation experiments as a function of many parameters, including pulse energy, pulse duration, number of pulses, time between pulses, and focus size. As a proof of concept, we present example results on single-shot ablation off crystalline silicon. Using only data acquired in situ in the presented setup, we determine the single-shot ablation threshold as a function of pulse duration and verify the threshold value using optical interferometric profilometry. The values we found agree well with literature values. (C) 2022 Author(s).
引用
收藏
页数:11
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