New surface resistance measurement technique of high-temperature superconductors using a probe coupling microstrip line resonator

被引:6
|
作者
Okai, D [1 ]
Kusunoki, M [1 ]
Mukaida, M [1 ]
Ohshima, S [1 ]
机构
[1] Yamagata Univ, Fac Engn, Yonezawa, Yamagata 9928510, Japan
关键词
microstrip line resonator; fine-wire; quality factor; surface resistance;
D O I
10.1109/77.919713
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have developed a new surface resistance (R-s) measurement technique of high-temperature superconductors using a probe coupling microstrip line resonator. In this technique, the probe coupling method is used to measure the R-s of superconductors without attaching any contacts to the superconductors, This paper reports the measurement process of the R-s of a superconducting fine-wire using this technique. The quality Factors of the copper wires, gold fine-wire and the Bi-Sr-Ca-Cu-O whisker crystal were measured by the probe coupling resonator method. The measurement results revealed that this technique is feasible for the R-s measurement of the superconducting fine-wire.
引用
收藏
页码:3078 / 3081
页数:4
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