Improving the red wavelength sensitivity of CCDs

被引：5

作者：

Jorden, Paul R. ^{[1
]}

Downing, Mark ^{[2
]}

Harris, Andrew ^{[1
]}

Kelt, Andrew ^{[1
]}

Mistry, Pritesh ^{[1
]}

Patel, Pash ^{[1
]}

机构：

[1] E2v Technol, 106 Waterhouse Lane, Chelmsford CM1 2QU, Essex, England

[2] ESO, D-85748 Garching, Germany

来源：

HIGH ENERGY, OPTICAL, AND INFRARED DETECTORS FOR ASTRONOMY IV | 2010年 / 7742卷

关键词：

CCD; astronomy; high-rho; bulk silicon; full depletion; Anti-reflection coating; red response;

D O I：

10.1117/12.862435

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

The demand for higher red wavelength sensitivity is being met by various technological developments of modern CCDs. We discuss techniques for achieving higher red wavelength sensitivity by using thicker silicon to make backthinned CCDs, which combines with very low read noise for enhanced sensitivity. Thicker devices requires higher resistivity material including bulk (non epitaxial) silicon. An extended wavelength range also places more demand on the antireflection coatings which benefit from corresponding optimisation.

引用

页数：11

共 5 条

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