Extension of the 3ω method to measure the thermal conductivity of thin films without a reference sample

被引:34
作者
Alvarez-Quintana, J. [1 ]
Rodriguez-Viejo, J. [1 ]
机构
[1] Univ Autonoma Barcelona, Dept Fis, Grp Nanomat & Microsistemas, Bellaterra 08193, Spain
关键词
thermal conductivity; Thin films; 3 omega method;
D O I
10.1016/j.sna.2007.01.013
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The 3 omega method has been extensively used to measure the thermal conductivity of bulk and thin film dielectric materials. In practice it is basically a differential technique since it is necessary to process two samples that are identical except for the layer of interest, and in some cases the reference sample may not be available. In this contribution we show that it is possible to simultaneously measure the thermal conductivity of both the substrate and the thin film without the need for a reference sample. Two sensors of different widths are used to extract values from the substrate and the layer of interest. This method is applied to measure the out-of-plane thermal conductivity of a-SiO2 and a-SiN, films grown on a Si substrate. (C) 2007 Elsevier B.V. All fights reserved.
引用
收藏
页码:232 / 236
页数:5
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