Atomic force microscopy as a tool to study the distribution of rubber in high impact poly(propylene) particles

被引：12
作者：
Bouzid, D
Gaboriaud, F
McKenna, TE
机构：
[1] ESCPE Lyon, CNRS, LCPP, F-69616 Villeurbanne, France
[2] UHP Nancy, CNRS, LCPME, F-54600 Villers Les Nancy, France
来源：
MACROMOLECULAR MATERIALS AND ENGINEERING | 2005年 / 290卷 / 06期
关键词：
atomic force microscopy (AFM); ethylene propylene rubber; impact copolymers; morphology; poly(propylene) (PP);
D O I：
10.1002/mame.200400248
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Atomic force microscopy (AFM) was used as a tool to explore the nanomechanical properties of isostatic poly(propylene) (PP) homopolymer and a high impact poly(propylene) (hiPP) products with the different rubber contents. It was shown that the interpretation of the approach curves (forces vs. piezo displacement) allows one to identify the relative amounts of rubber at different spots within the particles. In addition, it was possible to differentiate between the areas where the rubber layers were less than 10nm thick, and those where there was more rubber. Comparison of the mechanical properties of PP and hiPP particles allowed us to propose a model for the distribution of rubber within the particles.
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页码：565 / 572
页数：8
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