Responsivity Enhanced NMOSFET Photodetector Fabricated by Standard CMOS Technology

被引:0
作者
Wu, Fuwei [1 ]
Ji, Xiaoli [1 ]
Yan, Feng [1 ]
机构
[1] Nanjing Univ, Sch Elect Sci & Technol, Nanjing 210046, Jiangsu, Peoples R China
关键词
D O I
10.1155/2015/639769
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Increasing the responsivity is one of the important issues for a photodetector. In this paper, we demonstrate an improved NMOSFET photodetector by using deep-n-well (DNW) structure which can improve the responsivity of the photodetector significantly. The experimental results show that the responsivity can be enhanced greatly by the DNW structure and is much larger than the previous work when DNW is biased with 0.5 V, while the dark current exhibits almost no increase. Further characterization indicates that the diode formed by the bulk and DNW can efficiently absorb photons and has a large gain factor of the photocurrent especially under low light condition, which gives a more promising application for the detector to detect the weak light.
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页数:5
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