Engineering ferroelectric tunnel junctions through potential profile shaping
被引:33
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作者:
Boyn, S.
论文数: 0引用数: 0
h-index: 0
机构:
CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Univ Paris 11, F-91405 Orsay, FranceCNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Boyn, S.
[1
,2
]
Garcia, V.
论文数: 0引用数: 0
h-index: 0
机构:
CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Univ Paris 11, F-91405 Orsay, FranceCNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Garcia, V.
[1
,2
]
Fusil, S.
论文数: 0引用数: 0
h-index: 0
机构:
CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Univ Paris 11, F-91405 Orsay, FranceCNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Fusil, S.
[1
,2
]
Carretero, C.
论文数: 0引用数: 0
h-index: 0
机构:
CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Univ Paris 11, F-91405 Orsay, FranceCNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Carretero, C.
[1
,2
]
Garcia, K.
论文数: 0引用数: 0
h-index: 0
机构:
CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Univ Paris 11, F-91405 Orsay, FranceCNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Garcia, K.
[1
,2
]
Xavier, S.
论文数: 0引用数: 0
h-index: 0
机构:
Thales Res & Technol, F-91767 Palaiseau, FranceCNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Xavier, S.
[3
]
论文数: 引用数:
h-index:
机构:
Collin, S.
[1
,2
]
Deranlot, C.
论文数: 0引用数: 0
h-index: 0
机构:
CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Univ Paris 11, F-91405 Orsay, FranceCNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Deranlot, C.
[1
,2
]
Bibes, M.
论文数: 0引用数: 0
h-index: 0
机构:
CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Univ Paris 11, F-91405 Orsay, FranceCNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Bibes, M.
[1
,2
]
Barthelemy, A.
论文数: 0引用数: 0
h-index: 0
机构:
CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Univ Paris 11, F-91405 Orsay, FranceCNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Barthelemy, A.
[1
,2
]
机构:
[1] CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
[2] Univ Paris 11, F-91405 Orsay, France
[3] Thales Res & Technol, F-91767 Palaiseau, France
来源:
APL MATERIALS
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2015年
/
3卷
/
06期
基金:
欧洲研究理事会;
关键词:
GIANT ELECTRORESISTANCE;
D O I:
10.1063/1.4922769
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
We explore the influence of the top electrode materials (W, Co, Ni, Ir) on the electronic band profile in ferroelectric tunnel junctions based on super-tetragonal BiFeO3. Large variations of the transport properties are observed at room temperature. In particular, the analysis of current vs. voltage curves by a direct tunneling model indicates that the metal/ferroelectric interfacial barrier height increases with the top-electrode work function. While larger metal work functions result in larger OFF/ON ratios, they also produce a large internal electric field which results in large and potentially destructive switching voltages. (C) 2015 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
机构:Sun Yat Sen Univ, State Key Lab Optoelect Mat & Technol, Inst Optoelect & Funct Composite Mat, Guangzhou 510275, Guangdong, Peoples R China
Luo, Xin
Lin, S. P.
论文数: 0引用数: 0
h-index: 0
机构:Sun Yat Sen Univ, State Key Lab Optoelect Mat & Technol, Inst Optoelect & Funct Composite Mat, Guangzhou 510275, Guangdong, Peoples R China
Lin, S. P.
Wang, Biao
论文数: 0引用数: 0
h-index: 0
机构:
Sun Yat Sen Univ, State Key Lab Optoelect Mat & Technol, Inst Optoelect & Funct Composite Mat, Guangzhou 510275, Guangdong, Peoples R ChinaSun Yat Sen Univ, State Key Lab Optoelect Mat & Technol, Inst Optoelect & Funct Composite Mat, Guangzhou 510275, Guangdong, Peoples R China
Wang, Biao
Zheng, Yue
论文数: 0引用数: 0
h-index: 0
机构:Sun Yat Sen Univ, State Key Lab Optoelect Mat & Technol, Inst Optoelect & Funct Composite Mat, Guangzhou 510275, Guangdong, Peoples R China
机构:
Univ Modena & Reggio Emilia, DIEF, Via P Vivarelli 10-1, I-41125 Modena, ItalyUniv Modena & Reggio Emilia, DIEF, Via P Vivarelli 10-1, I-41125 Modena, Italy
Benatti, Lorenzo
Vecchi, Sara
论文数: 0引用数: 0
h-index: 0
机构:
Univ Modena & Reggio Emilia, DIEF, Via P Vivarelli 10-1, I-41125 Modena, ItalyUniv Modena & Reggio Emilia, DIEF, Via P Vivarelli 10-1, I-41125 Modena, Italy
Vecchi, Sara
Puglisi, Francesco Maria
论文数: 0引用数: 0
h-index: 0
机构:
Univ Modena & Reggio Emilia, DIEF, Via P Vivarelli 10-1, I-41125 Modena, ItalyUniv Modena & Reggio Emilia, DIEF, Via P Vivarelli 10-1, I-41125 Modena, Italy
Puglisi, Francesco Maria
2022 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP, IIRW,
2022,