Pattern recognition based tools enabling autonomic computing.

被引:0
作者
Bougaev, AA [1 ]
机构
[1] Purdue Univ, W Lafayette, IN 47907 USA
来源
ICAC 2005: Second International Conference on Autonomic Computing, Proceedings | 2005年
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Fault detection is one of the important constituents of fault tolerance, which in turn defines the dependability of autonomic computing. In presented work several pattern recognition tools were investigated in application to early fault detection. The optimal margin classifier technique was utilized to detect the abnormal behavior of software processes. The comparison with the performance of the quadratic classifiers is reported. The optimal margin classifiers were also implemented to the fault detection in hardware components. The impulse parameter probing technique was introduced to mitigate intermittent and transient fault problems. The pattern recognition framework of analysis of responses to a controlled component perturbation yielded promising results.
引用
收藏
页码:313 / 314
页数:2
相关论文
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[2]  
Trivedi K. S., 2000, Proceedings 33rd Annual Simulation Symposium (SS 2000), P270, DOI 10.1109/SIMSYM.2000.844925
[3]  
Vapnik V., 1998, STAT LEARNING THEORY, V1, P2