Damage and ablation thresholds of fused-silica in femtosecond regime

被引:255
作者
Chimier, B. [1 ]
Uteza, O. [1 ]
Sanner, N. [1 ]
Sentis, M. [1 ]
Itina, T. [2 ]
Lassonde, P. [3 ]
Legare, F. [3 ]
Vidal, F. [3 ]
Kieffer, J. C. [3 ]
机构
[1] Univ Mediterranee, CNRS, UMR 6182, Lab LP3, F-13288 Marseille 9, France
[2] Univ St Etienne, CNRS, UMR 5516, Lab Hubert Curien LaHC, F-42000 St Etienne, France
[3] INRS, Varennes, PQ J3X 1S2, Canada
关键词
LASER-INDUCED DAMAGE; IMPACT IONIZATION; OPTICAL-BREAKDOWN; PULSE DURATION; DIELECTRICS; NANOSECOND; SIO2; SOLIDS; FS; PICOSECOND;
D O I
10.1103/PhysRevB.84.094104
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present an experimental and numerical study of the damage and ablation thresholds at the surface of a dielectric material, e. g., fused silica, using short pulses ranging from 7 to 300 fs. The relevant numerical criteria of damage and ablation thresholds are proposed consistently with experimental observations of the laser irradiated zone. These criteria are based on lattice thermal melting and electronic cohesion temperature, respectively. The importance of the three major absorption channels (multi-photon absorption, tunnel effect, and impact ionization) is investigated as a function of pulse duration (7-300 fs). Although the relative importance of the impact ionization process increases with the pulse duration, our results show that it plays a role even at short pulse duration (<50 fs). For few optical cycle pulses (7 fs), it is also shown that both damage and ablation fluence thresholds tend to coincide due to the sharp increase of the free electron density. This electron-driven ablation regime is of primary interest for thermal-free laser-matter interaction and therefore for the development of high quality micromachining processes.
引用
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页数:10
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