A Reliability Prediction Methodology for LED Arrays

被引：5

作者：

Sun, Bo ^{[1
]}

Fan, Jiajie ^{[2
]}

Fan, Xuejun ^{[3
]}

Zhang, Guoqi ^{[4
]}

Zhang, Guohao ^{[1
]}

机构：

[1] Guangdong Univ Technol, Fac Informat Engn, Guangzhou 510006, Guangdong, Peoples R China

[2] Hohai Univ, Coll Mech & Elect Engn, Changzhou 213022, Peoples R China

[3] Lamar Univ, Dept Mech Engn, Beaumont, TX 77710 USA

[4] Delft Univ Technol, Dept Microelect, NL-2628 CD Delft, Netherlands

来源：

IEEE ACCESS | 2019年 / 7卷

关键词：

Catastrophic failure; electronic-thermal model; LED array; Markov chain; reliability prediction; LIGHT-EMITTING-DIODES; WHITE-LIGHT; PHOSPHOR; LUMINESCENCE; PROGNOSTICS; EFFICIENCY; LAYERS;

D O I：

10.1109/ACCESS.2018.2887252

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, a physics of failure-based prediction method is combined with statistical models to consider the impact of current crowding and current droop effects on the reliability of LED arrays. Electronic-thermal models of LEDs are utilized to obtain the operation conditions under the influences of current crowding and current droop. A Markov chain-based model is used to calculate the probability distribution of each failure mode, including the lumen decay and catastrophic failure. Two types of LEDs were selected for a numerical study. The proposed prediction method provides the realistic reliability prediction results. It is found that the properties of LEDs have a great impact on their hazard rates of LED arrays. The equivalent resistance, third-order non-radiative coefficient, and radiative coefficient of LEDs are critical to the reliability of an LED array.

引用

页码：8127 / 8134

页数：8

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