Change of Crystallographic Orientation Characteristics of (001)-Oriented Electrodeposited Silver Films during Self-Annealing at Room Temperature
被引:1
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作者:
Hayashi, Yumi
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机构:
Gunma Univ, Grad Sch Sci & Technol, 1-5-1 Tenjin Cho, Kiryu, Gunma 3768515, JapanGunma Univ, Grad Sch Sci & Technol, 1-5-1 Tenjin Cho, Kiryu, Gunma 3768515, Japan
Hayashi, Yumi
[1
]
Shohji, Ikuo
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h-index: 0
机构:
Gunma Univ, Grad Sch Sci & Technol, 1-5-1 Tenjin Cho, Kiryu, Gunma 3768515, JapanGunma Univ, Grad Sch Sci & Technol, 1-5-1 Tenjin Cho, Kiryu, Gunma 3768515, Japan
Shohji, Ikuo
[1
]
论文数: 引用数:
h-index:
机构:
Koyama, Shinji
[1
]
论文数: 引用数:
h-index:
机构:
Miyazawa, Hiroshi
[2
]
机构:
[1] Gunma Univ, Grad Sch Sci & Technol, 1-5-1 Tenjin Cho, Kiryu, Gunma 3768515, Japan
[2] DOWA METALTECH Co Ltd, 1781 Nitte, Honjo 3670002, Japan
来源:
ADVANCES IN MATERIAL & PROCESSING TECHNOLOGIES CONFERENCE
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2017年
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184卷
关键词:
Electrodeposited silver film;
Self-annealing;
Electron back scatter diffraction patterns;
In situ observation;
Crystal orientation;
D O I:
10.1016/j.proeng.2017.04.148
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Self-annealing behaviors of the electrodeposited silver films which preferentially orient in the (001) direction were investigated by in situ EBSD analysis. Self-annealing started in storage for a few hours at room temperature (R. T.) and was almost complete after storage for 6 h at R. T. In the initial stage of self-annealing, recrystallization of (001)-oriented grains progressed with the formation of twins with (212) orientation. Membrane stress in the as-electrodeposited film was compression stress of approximately 20 MPa. The compression membrane stress seems to become driving force for self-annealing of the (001)-oriented electrodeposited silver film. Membrane stress in the film changed from compression stress to tensile stress by recrystallization in self-annealing. (C) 2017 The Authors. Published by Elsevier Ltd.