Highly conductive ZnO grown by pulsed laser deposition in pure Ar

被引:40
作者
Scott, Robin C. [1 ]
Leedy, Kevin D. [2 ]
Bayraktaroglu, Burhan [2 ]
Look, David C. [3 ]
Zhang, Yong-Hang [4 ]
机构
[1] Arizona State Univ, Sch Mech Aerosp Chem & Mat Engn, Tempe, AZ 85287 USA
[2] USAF, Res Lab, Wright Patterson AFB, OH 45433 USA
[3] Wright State Univ, Semicond Res Ctr, Dayton, OH 45435 USA
[4] Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA
基金
美国国家科学基金会;
关键词
annealing; electrical resistivity; elemental semiconductors; gallium; II-VI semiconductors; infrared spectra; pulsed laser deposition; semiconductor growth; semiconductor thin films; visible spectra; wide band gap semiconductors; zinc compounds; THIN-FILMS; TRANSPARENT; AL;
D O I
10.1063/1.3481372
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ga-doped ZnO was deposited by pulsed laser deposition at 200 degrees C on SiO(2)/Si, Al(2)O(3), or quartz in 10 mTorr of pure Ar. The as-grown, bulk resistivity at 300 K is 1.8x10(-4) cm, three-times lower than that of films deposited at 200 degrees C in 10 mTorr of O(2) followed by an anneal at 400 degrees C in forming gas. Furthermore, depth uniformity of the electrical properties is much improved. Mobility analysis shows that this excellent resistivity is mostly due to an increase in donor concentration, rather than a decrease in acceptor concentration. Optical transmittance is approximately 90% in the visible and near-IR spectral regions. (C) 2010 American Institute of Physics. [doi:10.1063/1.3481372]
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页数:3
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