Differential method for observing defects with the use of a combined polarized radiation

被引：1

作者：

Chudakov, VS ^{[1
]}

机构：

[1] Russian Acad Sci, Inst Crystallog, Moscow 117333, Russia

来源：

CRYSTALLOGRAPHY REPORTS | 2001年 / 46卷 / 02期

关键词：

Radiation; Optical Property; Refraction; Flaw Detection; Scanning Image;

D O I：

10.1134/1.1358407

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The conditions for ohserving crystal defects by a new differential method based on the use of combined radiation with two equally intense orthogonally polarized components have been considered. The conditions for recording three groups of defects possessing different optical properties (absorption, scattering, polarizability, and refraction) are indicated. The new method is implemented on the basis of a scanning image converter widely used in optical flaw detection of crystals. (C) 2001 MAIK "Nauka/Interperiodica".

引用

页码：284 / 287

页数：4