Time-domain reflection field analysis for ultrasonic evaluation of thin layered media

被引:3
作者
Kim, BG [1 ]
Lee, S [1 ]
Kishi, T [1 ]
机构
[1] UNIV TOKYO,ADV SCI & TECHNOL RES CTR,MEGURO KU,TOKYO 153,JAPAN
关键词
time-domain; reflection; thin layers;
D O I
10.1016/S0963-8695(96)00035-7
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In conventional ultrasonic testing of a thin layer with thickness less than about twice the wavelength, successive echo signals become inseparable. Recently, a new time-domain analysis technique to determine the thickness or the wave velocity of a thin plate was developed and through-transmission experiments were reported. We have studied the validity of the technique and its applicability to contact testing under a reflection field system. We found a mistake in the derivation of the reconstructed reflection field equation reported, and a correction has been made. We performed the experiment in a reflection field system using contact type transducers of centre frequency 1, 2.25, and 5 MHz with water layers of thickness ranging from 0.06 to 1.44 mm (0.04 less than or equal to thickness/wavelength < 5). Thickness and wave velocity were determined within 7% error for the ratio of thickness to wavelength (h*/lambda) larger than about 0.4, 3% for h*/lambda larger than 0.8, and 1% for h*/lambda larger than 2. The time domain technique with our corrected equation was applicable to the evaluation of a thin layered medium under reflection system using contact type transducers. Copyright (C) 1996 Elsevier Science Ltd.
引用
收藏
页码:317 / 322
页数:6
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