Neuro-genetic approach on logistic model based software reliability prediction

被引:28
作者
Roy, Pratik [1 ]
Mahapatra, G. S. [2 ]
Dey, K. N. [1 ]
机构
[1] Univ Calcutta, Dept Comp Sci & Engn, Kolkata 700009, India
[2] Natl Inst Technol Puducherry, Dept Math, Karaikal 609605, India
关键词
Artificial neural network; Genetic algorithm; Back-propagation algorithm; Logistic growth curve model; Software reliability; Prediction; FAULT-DETECTION; GROWTH-MODELS; NETWORKS;
D O I
10.1016/j.eswa.2015.01.043
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
In this paper, we propose a multi-layer feedforward artificial neural network (ANN) based logistic growth curve model (LGCM) for software reliability estimation and prediction. We develop the ANN by designing different activation functions for the hidden layer neurons of the network. We explain the ANN from the mathematical viewpoint of logistic growth curve modeling for software reliability. We also propose a neuro-genetic approach for the ANN based LGCM by optimizing the weights of the network using proposed genetic algorithm (GA). We first train the ANN using back-propagation algorithm (BPA) to predict software reliability. After that, we use the proposed GA to train the ANN by globally optimizing the weights of the network. The proposed ANN based LGCM is compared with the traditional Non-homogeneous Poisson process (NHPP) based software reliability growth models (SRGMs) and ANN based software reliability models. We present the comparison between the two training algorithms when they are applied to train the proposed ANN to predict software reliability. The applicability of the different approaches is explained through three real software failure data sets. Experimental results demonstrate that the proposed ANN based LGCM has better fitting and predictive capability than the other NHPP and ANN based software reliability models. It is also noted that when the proposed GA is employed as the learning algorithm to the ANN, the proposed ANN based LGCM gives more fitting and prediction accuracy i.e. the proposed neuro-genetic approach to the LGCM provides utmost predictive validity. Proposed model can be applied during software testing time to get better software reliability estimation and prediction than the other traditional NHPP and ANN based software reliability models. (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码:4709 / 4718
页数:10
相关论文
共 37 条
[1]  
[Anonymous], 1996, HDB SOFTWARE RELIABI
[2]   On the neural network approach in software reliability modeling [J].
Cai, KY ;
Cai, L ;
Wang, WD ;
Yu, ZY ;
Zhang, D .
JOURNAL OF SYSTEMS AND SOFTWARE, 2001, 58 (01) :47-62
[3]   A comparison of some soft computing methods for software fault prediction [J].
Erturk, Ezgi ;
Sezer, Ebru Akcapinar .
EXPERT SYSTEMS WITH APPLICATIONS, 2015, 42 (04) :1872-1879
[4]   TIME-DEPENDENT ERROR-DETECTION RATE MODEL FOR SOFTWARE RELIABILITY AND OTHER PERFORMANCE-MEASURES [J].
GOEL, AL ;
OKUMOTO, K .
IEEE TRANSACTIONS ON RELIABILITY, 1979, 28 (03) :206-211
[5]  
Haykin S., 2012, Neural Networks and Learning Machines
[6]   Robust recurrent neural network modeling for software fault detection and correction prediction [J].
Hu, Q. P. ;
Xie, M. ;
Ng, S. H. ;
Levitin, G. .
RELIABILITY ENGINEERING & SYSTEM SAFETY, 2007, 92 (03) :332-340
[7]   A unified scheme of some Nonhomogenous Poisson process models for software reliability estimation [J].
Huang, CY ;
Lyu, MR ;
Kuo, SY .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2003, 29 (03) :261-269
[8]   Analysis of incorporating logistic testing-effort function into software reliability modeling [J].
Huang, CY ;
Kuo, SY .
IEEE TRANSACTIONS ON RELIABILITY, 2002, 51 (03) :261-270
[9]   Flexible software reliability growth model with testing effort dependent learning process [J].
Kapur, P. K. ;
Goswami, D. N. ;
Bardhan, Amit ;
Singh, Ompal .
APPLIED MATHEMATICAL MODELLING, 2008, 32 (07) :1298-1307
[10]   A Unified Approach for Developing Software Reliability Growth Models in the Presence of Imperfect Debugging and Error Generation [J].
Kapur, P. K. ;
Pham, H. ;
Anand, Sameer ;
Yadav, Kalpana .
IEEE TRANSACTIONS ON RELIABILITY, 2011, 60 (01) :331-340