High Energy Chemistry;
Mica Surface;
Order Nonlinearity;
Closed Aperture;
Silicon Photodiode;
D O I:
10.1134/S001814391103009X
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
The third-order susceptibility of tetrachloroethane dispersions of capped single-wall carbon nanotubes (SWCNT) has been analyzed by the z-scan technique using a femtosecond laser, and the SWCNT image obtained by atomic force microscopy has been also presented.