Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon

被引:11
作者
Nakarmi, P. [1 ]
Ostrovskiy, I. [1 ]
Soma, A. K. [1 ]
Retiere, F. [2 ]
Al Kharusi, S. [3 ]
Alfaris, M. [4 ,5 ]
Anton, G. [6 ]
Arnquist, I. J. [7 ]
Badhrees, I. [8 ]
Barbeau, P. S. [9 ,10 ]
Beck, D. [11 ]
Belov, V. [12 ]
Bhatta, T. [13 ]
Blatchford, J. [4 ,5 ]
Breur, P. A. [14 ]
Brodsky, J. P. [15 ]
Brown, E. [16 ]
Brunner, T. [2 ,3 ]
Mamahit, S. Byrne [2 ]
Caden, E. [17 ]
Cao, G. F. [18 ]
Cao, L. [19 ]
Chambers, C. [3 ]
Chana, B. [8 ]
Charlebois, S. A. [20 ]
Chiu, M. [21 ]
Cleveland, B. [17 ]
Coon, M. [11 ]
Craycraft, A. [22 ]
Dalmasson, J. [23 ]
Daniels, T. [24 ]
Darroch, L. [3 ]
De St Croix, A. [2 ,27 ]
Der Mesrobian-Kabakian, A. [17 ]
DeVoe, R. [23 ]
Di Vacri, M. L. [7 ]
Dilling, J. [2 ,27 ]
Ding, Y. Y. [18 ]
Dolinski, M. J. [28 ]
Doria, L. [2 ]
Dragone, A. [14 ]
Echevers, J. [11 ]
Edaltafar, F. [2 ]
Elbeltagi, M. [8 ]
Fabris, L. [29 ]
Fairbank, D. [11 ]
Fairbank, W. [22 ]
Farine, J. [17 ]
Ferrara, S. [7 ]
Feyzbakhsh, S. [4 ,5 ]
机构
[1] Univ Alabama, Dept Phys & Astron, Tuscaloosa, AL 35487 USA
[2] TRIUMF, Vancouver, BC V6T 2A3, Canada
[3] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada
[4] Univ Massachusetts, Amherst Ctr Fundamental Interact, Amherst, MA 01003 USA
[5] Univ Massachusetts, Dept Phys, Amherst, MA 01003 USA
[6] Friedrich Alexander Univ Erlangen Nurnberg, ECAP, D-91058 Erlangen, Germany
[7] Pacific Northwest Natl Lab, Richland, WA 99352 USA
[8] Carleton Univ, Dept Phys, Ottawa, ON K1S 5B6, Canada
[9] Duke Univ, Dept Phys, Durham, NC 27708 USA
[10] TUNL, Durham, NC 27708 USA
[11] Univ Illinois, Dept Phys, 1110 W Green St, Urbana, IL 61801 USA
[12] Natl Res Ctr Kurchatov Inst, Inst Theoret & Expt Phys, Moscow 117218, Russia
[13] Univ South Dakota, Dept Phys, Vermillion, SD 57069 USA
[14] SLAC Natl Accelerator Lab, Menlo Pk, CA 94025 USA
[15] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[16] Rensselaer Polytech Inst, Dept Phys Appl Phys & Astron, Troy, NY 12180 USA
[17] Laurentian Univ, Dept Phys, Sudbury, ON P3E 2C6, Canada
[18] Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China
[19] Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
[20] Univ Sherbrooke, Sherbrooke, PQ J1K 2R1, Canada
[21] Brookhaven Natl Lab, Upton, NY 11973 USA
[22] Colorado State Univ, Dept Phys, Ft Collins, CO 80523 USA
[23] Stanford Univ, Dept Phys, Stanford, CA 94305 USA
[24] Univ N Carolina, Dept Phys & Phys Oceanog, Wilmington, NC 28403 USA
[25] Indiana Univ, Dept Phys, Bloomington, IN 47405 USA
[26] Indiana Univ, CEEM, Bloomington, IN 47405 USA
[27] Univ British Columbia, Dept Phys & Astron, Vancouver, BC V6T 1Z1, Canada
[28] Drexel Univ, Dept Phys, Philadelphia, PA 19104 USA
[29] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
[30] Yale Univ, Dept Phys, Wright Lab, New Haven, CT 06511 USA
[31] Colorado Sch Mines, Dept Phys, Golden, CO 80401 USA
[32] IBS Ctr Underground Phys, Daejeon 34126, South Korea
[33] SUNY Stony Brook, Dept Phys & Astron, Stony Brook, NY 11794 USA
[34] Univ Bern, Albert Einstein Ctr, LHEP, CH-3012 Bern, Switzerland
来源
JOURNAL OF INSTRUMENTATION | 2020年 / 15卷 / 01期
基金
加拿大自然科学与工程研究理事会;
关键词
Dark Matter detectors (WIMPs; axions; etc.); Double-beta decay detectors; Noble liquid detectors (scintillation; ionization; double-phase); Photon detectors for UV; visible and IR photons (solid-state) (PIN diodes; APDs; Si-PMTs; G-APDs; CCDs; EBCCDs; EMCCDs; CMOS; imagers; etc); PHOTON DETECTION EFFICIENCY; SILICON PHOTOMULTIPLIERS; OPTICAL-CONSTANTS; LIGHT;
D O I
10.1088/1748-0221/15/01/P01019
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE. Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 mu m micro-cells conducted with xenon scintillation light (similar to 175 nm) in liquid xenon. The specular reflectivity at 15 degrees incidence of three samples of VUV4 SiPMs is found to be 30.4 +/- 1.4%, 28.6 +/- 1.3%, and 28.0 +/- 1.3%, respectively. The PDE at normal incidence differs by +/- 8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.
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页数:25
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