Directional wavelets revisited: Cauchy wavelets and symmetry detection in patterns

被引:73
作者
Antoine, JP [1 ]
Murenzi, R
Vandergheynst, P
机构
[1] Univ Catholique Louvain, Inst Phys Theor, B-1348 Louvain, Belgium
[2] Clark Atlanta Univ, CTSPS, Atlanta, GA 30314 USA
[3] Clark Atlanta Univ, Dept Phys, Atlanta, GA 30314 USA
关键词
D O I
10.1006/acha.1998.0255
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
The analysis of oriented features in images requires two-dimensional directional wavelets. Among these, we study in detail the class of Cauchy wavelets, which are strictly supported in a (narrow) convex cone in spatial frequency space. They have excellent angular selectivity, as shown by a standard calibration test, and they have minimal uncertainty. In addition, we present a new application of directional wavelets, namely a technique for determining the symmetries of a given pattern with respect to rotations and dilation. (C) 1999 Academic Press.
引用
收藏
页码:314 / 345
页数:32
相关论文
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