Exchange bias and coercivity fields as a function of the antiferromagnetic layer thickness in bi- and tri-layered thin- films based on IrMn and NiFe

被引：6

作者：

Gritsenko, Christina ^{[1
]}

Dzhun, Irina ^{[2
]}

Babaytsev, Georgy ^{[2
]}

Chechenin, Nikolai ^{[2
]}

Rodionova, Valeria ^{[1
,3
]}

机构：

[1] Immanuel Kant Balt Fed Univ, Kaliningrad 236004, Russia

[2] Lomonosov Moscow State Univ, Skobeltsyn Inst Nucl Phys, Moscow 119991, Russia

[3] Natl Univ Sci & Technol MISiS, Moscow 119049, Russia

来源：

INTERNATIONAL BALTIC CONFERENCE ON MAGNETISM: FOCUS ON BIOMEDICAL ASPECTS, IBCM 2015 | 2016年 / 82卷

关键词：

Exchange bias; layered thin films; TEMPERATURE; INTERFACES; ROUGHNESS;

D O I：

10.1016/j.phpro.2016.05.010

中图分类号：

Q6 [生物物理学];

学科分类号：

071011 ;

摘要：

The exchange bias phenomenon in bilayered and trilayered thin films, based on NiFe and IrMn, was studied. The exchange bias and coercivity fields dependences on the antiferromagnetic layer thickness were obtained. It was shown that 6 nm of IrMn is a critical thickness for the exchange bias appearance. Largest value of the exchange bias is found to be for NiFe/IrMn/NiFe sample with 10 nm thickness of antiferromagnetic layer. (C) 2016 The Authors. Published by Elsevier B.V.

引用

页码：51 / 55

页数：5

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