Extraction of Saturation Current and Ideality Factor from Measuring Voc and Isc of Photovoltaic Modules

被引:61
作者
Meyer, E. L. [1 ]
机构
[1] Univ Ft Hare, Inst Technol, Private Bag X1314, ZA-5700 Alice, South Africa
基金
新加坡国家研究基金会;
关键词
HYDROGENATED AMORPHOUS-SILICON; PERFORMANCE; DEGRADATION; FILMS;
D O I
10.1155/2017/8479487
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Saturation current (I-0) and ideality factor (n) of a p-n junction solar cell are an indication of the quality of the cell. These two parameters are usually estimated from dark current-voltage measurements. In this study, a quick and easy method to determine these two parameters by measuring open-circuit, V-oc, and short-circuit current, I-sc, is presented. Solar cell designers can use this method as a grading or diagnostic tool to evaluate degradation in photovoltaic (PV) modules. In order to verify the V-oc-I-sc method, a series of experiments have been conducted on a single cell and a 36-cell module. Good agreement between our V-oc-I-sc method and dark I-V measurements was obtained. An application of the method on the performance degradation of a single-junction a-Si:H module revealed that the module's I0 increased by more than three orders of magnitude and n increased by 65% after an outdoor exposure of 130 kWh/m(2). This increase in n indicates that after exposure, the recombination current in the cells' space charge region increased due to the light-induced formation of metastable defects. The method is also used to assess the quality of five PV module technologies and proved to be reliable despite defective cells in a module.
引用
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页数:9
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