Current density effects on the microstructure of zirconium thin films

被引：43

作者：

Islam, Zahabul ^{[1
]}

Wang, Baoming ^{[1
]}

Haque, Aman ^{[1
]}

机构：

[1] Penn State Univ, Dept Mech & Nucl Engn, 314 Leonhard Bldg, University Pk, PA 16802 USA

来源：

SCRIPTA MATERIALIA | 2018年 / 144卷

基金：

美国国家科学基金会;

关键词：

In-situ TEM; Molecular dynamics; Grain growth; Electron wind force; Grain boundary; NANOCRYSTALLINE METALS; MOLECULAR-DYNAMICS; ELECTROMIGRATION; SIMULATION; ALLOYS; STRESS; SIZE;

D O I：

10.1016/j.scriptamat.2017.09.032

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We investigate the effect of electrical current density below the electromigration failure limit in nanocrystalline zirconium thin films using in-situ Transmission Electron Microscope and molecular dynamics simulation. At least one order of magnitude higher growth was seen at current density of 8.5 x 10(5) A/cm(2) (Joule heating temperature 710 K) in 15 min compared to conventional thermal annealing at 873 K for 360 min. Simulation results support our hypothesis that the concurrent effects of electron wind force and Joule heating specifically target the grain boundaries, producing much higher grain boundary mobility compared to high temperature annealing alone. (C) 2017 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：18 / 21

页数：4

共 22 条

[1] Overview no. 130 - Size effects in materials due to microstructural and dimensional constraints: A comparative review [J].

Arzt, E .

ACTA MATERIALIA, 1998, 46 (16) :5611-5626

[2]

Asokakumar P, 1996, APPL PHYS LETT, V68, P406, DOI 10.1063/1.116700

[3] Damage mechanics of electromigration induced failure [J].

Basaran, Cemal ;

Lin, Minghui .

MECHANICS OF MATERIALS, 2008, 40 (1-2) :66-79

[4] Electroplasticity in metals and ceramics [J].

Conrad, H .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2000, 287 (02) :276-287

[5] Theory for the electromigration wind force in dilute alloys [J].

Dekker, JP ;

Lodder, A ;

vanEk, J .

PHYSICAL REVIEW B, 1997, 56 (19) :12167-12177

[6] ELECTRICAL-RESISTIVITY OF VANADIUM AND ZIRCONIUM [J].

DESAI, PD ;

JAMES, HM ;

HO, CY .

JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA, 1984, 13 (04) :1097-1130

[7] Plasticity in small-sized metallic systems: Intrinsic versus extrinsic size effect [J].

Greer, Julia R. ;

De Hosson, Jeff Th. M. .

PROGRESS IN MATERIALS SCIENCE, 2011, 56 (06) :654-724

[8] Deformation mechanisms in free-standing nanoscale thin films:: A quantitative in situ transmission electron microscope study [J].

Haque, MA ;

Saif, MTA .

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2004, 101 (17) :6335-6340

[9] CURRENT-INDUCED MARKER MOTION IN GOLD WIRES [J].

HUNTINGTON, HB ;

GRONE, AR .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1961, 20 (1-2) :76-87

[10] A Review of Electrically-Assisted Manufacturing [J].

Huu-Duc Nguyen-Tran ;

Oh, Hyun-Seok ;

Hong, Sung-Tae ;

Han, Heung Nam ;

Cao, Jian ;

Ahn, Sung-Hoon ;

Chun, Doo-Man .

INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGY, 2015, 2 (04) :365-376

← 1 2 3 →