Frequency Reconfigurable Dual-Band CMOS Power Amplifier for Millimeter-Wave 5G Communications

被引:1
作者
Lee, Jaehun [1 ]
Paek, Ji-Seon [2 ]
Hong, Songcheol [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Wave Embedded Integrated Syst Lab, Daejeon, South Korea
[2] Samsung Elect, Suwon, Gyeonggi, South Korea
来源
2021 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) | 2021年
关键词
Dual band; power amplifiers; CMOS integrated circuits; 5G mobile communication;
D O I
10.1109/IMS19712.2021.9574873
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A frequency reconfigurable dual-band power amplifier (PA) with reconfigurable transmission line transformers (TLT) is presented, which can be operated at both the n257 (26.5-29.5 GHz) and n260 (37-40 GHz) 5G communication bands. The PA utilizes reconfigurable TLTs for output and input matching networks to reconfigure the PA between the n257 and n260 bands with optimal performance in both bands. The reconfigurable TLTs provide frequency reconfigurability to the PA by changing both the primary and secondary side inductances of the TLTs. The switches for the TLTs are located in the space inside the TLTs, which results in a small overall chip area. The dual-band PA is fabricated using a 28-nm bulk CMOS process. It achieves 20.2 and 19.1 dBm saturated output powers, 18.7 and 18.6 dBm 1-dB compressed output powers and 33.6% and 32% peak power added efficiencies at 26.5 and 37 GHz, respectively. The dual-band PA has a core size of 0.11 mm(2).
引用
收藏
页码:846 / 849
页数:4
相关论文
共 4 条
[1]  
[Anonymous], 2020, 381012V1650 3GPP TS
[2]   A 28-/37-/39-GHz Linear Doherty Power Amplifier in Silicon for 5G Applications [J].
Hu, Song ;
Wang, Fei ;
Wang, Hua .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2019, 54 (06) :1586-1599
[3]   A 28/60 GHz Dual-band Power Amplifier [J].
Nawaz, Asad Ali ;
Albrecht, John D. ;
Ulusoy, Ahmet Cagri .
2019 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS), 2019, :630-633
[4]   A Wideband Class-AB Power Amplifier With 29-57-GHz AM-PM Compensation in 0.9-V 28-nm Bulk CMOS [J].
Vigilante, Marco ;
Reynaert, Patrick .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2018, 53 (05) :1288-1301