A Bayesian network based approach for root-cause-analysis in manufacturing process

被引:20
|
作者
Pradhan, Satyabrata [1 ]
Singh, Rajveer [1 ]
Kachru, Komal [1 ]
Narasimhamurthy, Srinivas [1 ]
机构
[1] Infosys Technol Ltd, SET Labs, Bangalore 560100, Karnataka, India
来源
CIS: 2007 INTERNATIONAL CONFERENCE ON COMPUTATIONAL INTELLIGENCE AND SECURITY, PROCEEDINGS | 2007年
关键词
D O I
10.1109/CIS.2007.214
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
We describe an Early Warning System (EWS) which enables the root-cause-analysis for initiating quality improvements in the manufacturing shop floor and process-engineering departments, at product OEMs as well as their tiered suppliers. The EWS combines the use of custom-designed domain ontology of manufacturing processes and failure related knowledge, innovative application of domain knowledge in the form of probability constraints and a novel two-step constrained optimization approach to causal network construction. Probabilistic reasoning is the main vehicle for inference from the causal network. This inference engine provides the capability to do a root-cause-analysis in manufacturing scenarios, and is thus a powerful weapon for an automotive EWS. This technique is widely applicable and can be used in various contexts in the broader manufacturing industry as well.
引用
收藏
页码:10 / +
页数:2
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