Multifractal description of fracture morphology: Quasi-3D analysis of fracture surface

被引：0
|
作者：
Stach, S
Cwajna, J
Roskosz, S
Cybo, J
机构：
[1] Silesian Univ, Dept Mat Sci, PL-41200 Sosnowiec, Poland
[2] Silesian Tech Univ, Dept Mat Sci, PL-40019 Katowice, Poland
来源：
MATERIALS SCIENCE-POLAND | 2005年 / 23卷 / 02期
关键词：
fracture; surface; stereometry; overlaps; profile; multifractal; spectrum width;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The paper presents a verification of the multifractal analysis proposed in other papers. It has been found that the analysis of simulated profiles formed by removing overlaps and secondary cracks from a real profile ( which corresponds to a file obtained from a profilographometer) ensures proper diversity of fractal characterization, adequate for the degree of fracture surface development of the investigated grades of sintered carbide measured with a Taylor - Hobson's Talysurf 2 profilographometer.
引用
收藏
页码：567 / 575
页数：9
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