Fabrication of Single-Crystalline InSb-on-Insulator by Rapid Melt Growth

被引:3
|
作者
Menon, Heera [1 ,2 ]
Morgan, Nicholas Paul [3 ]
Hetherington, Crispin [2 ,4 ]
Athle, Robin [1 ,2 ]
Steer, Matthew [5 ]
Thayne, Iain [5 ]
Morral, Anna Fontcuberta, I [3 ]
Borg, Mattias [1 ,2 ]
机构
[1] Lund Univ, Elect & Informat Technol, S-22100 Lund, Sweden
[2] Lund Univ, Nano Lund, S-22100 Lund, Sweden
[3] Ecole Polytech Fed Lausanne, Lab Semicond Mat, CH-1015 Lausanne, Switzerland
[4] Lund Univ, Dept Chem, Ctr Anal & Synth & NanoLund, SE-22100 Lund, Sweden
[5] Univ Glasgow, Sch Engn, Glasgow G12 8QQ, Lanark, Scotland
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2022年 / 219卷 / 04期
基金
瑞士国家科学基金会;
关键词
electron backscatter diffraction (EBSD); InSb; rapid melt growth (RMG); single crystal; Si; TEM; XRR; CHEMICAL-VAPOR-DEPOSITION; SILICON-NITRIDE; III-V; SI; DIFFUSION; PLASMA; ELEMENTS;
D O I
10.1002/pssa.202100467
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
InSb has the smallest bandgap and highest electron mobility among III-V semiconductors and is widely used for photodetectors and high-frequency electronic applications. Integration of InSb directly on Si would drastically reduce the fabrication cost and enable new applications, however, it is very challenging due to its 19% lattice mismatch with Si. Herein, the integration of single-crystalline InSb microstructures on insulator-covered Si through rapid melt growth (RMG) is reported and specifically provides details on the fabrication process. The importance of achieving high-quality conformal capping layers at low thermal budget to contain the InSb melt is assessed when the sample is annealed. The importance of ensuring a pristine Si seed area to achieve single-crystalline InSb is illustrated and demonstrated here for the first time.
引用
收藏
页数:8
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