Grain-size distributions and grain boundaries of chalcopyrite-type thin films

被引：57

作者：

Abou-Ras, D. ^{[1
]}

Schorr, S. ^{[1
]}

Schock, H. W. ^{[1
]}

机构：

[1] Hahn Meitner Inst Berlin GmbH, Solar Energy Div, D-14109 Berlin, Germany

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2007年 / 40卷

关键词：

D O I：

10.1107/S0021889807032220

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

CuInSe2, CuGaSe2, Cu(In,Ga)Se-2 and CuInS2 thin-film solar absorbers in completed solar cells were studied in cross section by means of electronbackscatter diffraction. From the data acquired, grain-size distributions were extracted, and also the most frequent grain boundaries were determined. The grain-size distributions of all chalcopyrite-type thin films studied can be described well by lognormal distribution functions. The most frequent grainboundary types in these thin films are 60 degrees-< 221 >(tet) and 71 degrees-< 110 >(tet) ( near) Sigma 3 twin boundaries. These results can be related directly to the importance of {112} tet planes during the topotactical growth of chalcopyrite-type thin films. Based on energetic considerations, it is assumed that the most frequent twin boundaries exhibit a 180 degrees-< 221 >(tet) constellation.

引用

页码：841 / 848

页数：8

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