Silicon adatoms on the Si(111)5x2 Au surface

被引：38
|
作者：
Kirakosian, A
Crain, JN
Lin, JL
McChesney, JL
Petrovykh, DY
Himpsel, FJ
Bennewitz, R
机构：
[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland
[2] Univ Wisconsin, Dept Phys, Madison, WI 53706 USA
来源：
SURFACE SCIENCE | 2003年 / 532卷
关键词：
scanning tunneling microscopy; surface structure; morphology; roughness and topography; silicon; surface relaxation and reconstruction;
D O I：
10.1016/S0039-6028(03)00097-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Scanning tunneling microscopy iniages of the Si(1 1 1)5 x 2-Au surfaces exhibit irregularly distributed protrusions of atomic size. They are identified as silicon adatoms by evaporating small amounts of silicon and gold onto the reconstructed surface. While extra silicon increases. the. density of protrusions, extra gold transforms the reconstruction partially into a Si(1 1 1)root3 x root3 reconstruction. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：928 / 933
页数：6
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