Power Electronics and Electrical Insulation Systems - Part 2: Life Modeling for Insulation Design

被引：63

作者：

Cavallini, Andrea ^{[1
]}

Fabiani, Davide ^{[1
]}

Montanari, Gian Carlo ^{[1
]}

机构：

[1] Univ Bologna, LIMAT DIE, I-40136 Bologna, Italy

来源：

IEEE ELECTRICAL INSULATION MAGAZINE | 2010年 / 26卷 / 04期

关键词：

inverse power model; electrical aging; harmonic distortion; rotating machine; PWM; capacitor; FAILURE-MECHANISM; VOLTAGE; CABLE;

D O I：

10.1109/MEI.2010.5511187

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The reliability of electrical insulation systems under ac electrical stress has been investigated widely for decades. The concepts of dielectric strength, Weibull distribution of failure times, lifetime and voltage endurance coefficient are the basis for the design of highly reliable insulation systems in electrical apparatus [1]-[4]. Stress due to random voltage impulses, e.g., switching and lightning, which can exceed the breakdown impulse strength of the material and cause insulation failure, must also be considered. © 2006 IEEE.

引用

页码：33 / 39

页数：7

共 30 条

[1]

[Anonymous], 2020, document IEC 60034-18-42

[2]

[Anonymous], 60505 IEC

[3]

BELLOMO JP, 1994, PROCEEDINGS OF THE 4TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2, P792, DOI 10.1109/ICPADM.1994.414130

[4]

BELLOMO JP, 1996, THESIS U PAUL SABATI

[5]

CASADEI D, 2003, P CWIEME, P39

[6]

Cavallini A, 2000, IEEE IND APPLIC SOC, P3172

[7]

Cavallini A, 2000, PROCEEDINGS OF THE 6TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 & 2, P108, DOI 10.1109/ICPADM.2000.875641

[8]

CAVALLINI A, 2008, WIRE J INT NOV, P60

[9] Power Electronics and Electrical Insulation Systems - Part 1: Phenomenology Overview [J].

Cavallini, Andrea ;

Fabiani, Davide ;

Montanari, Gian Carlo .

IEEE ELECTRICAL INSULATION MAGAZINE, 2010, 26 (03) :7-15

[10] Impact of inverter drives employing fast-switching devices on form-wound AC machine stator cod stress grading [J].

Espino-Cortes, F. P. ;

Cherney, E. A. ;

Jayaram, S. H. .

IEEE ELECTRICAL INSULATION MAGAZINE, 2007, 23 (01) :16-28

← 1 2 3 →