In-situ IR synchrotron mapping ellipsometry on stimuli-responsive PAA-b-PS/PEG mixed polymer brushes

被引：13

作者：

Aulich, Dennis ^{[1
]}

Hoy, Olha ^{[2
]}

Luzinov, Igor ^{[2
]}

Eichhorn, Klaus-Jochen ^{[3
]}

Stamm, Manfred ^{[3
]}

Gensch, Michael ^{[4
]}

Schade, Ullrich ^{[4
]}

Esser, Norbert ^{[1
]}

Hinrichs, Karsten ^{[1
]}

机构：

[1] Inst Analyt Sci ISAS, Dept Berlin, Albert Einstein Str 9, D-12489 Berlin, Germany

[2] Clemson Univ, Sch Mat Sci & Engng, Clemson, SC 29634 USA

[3] Leibniz Inst Polymerforschung Dresden, D-01069 Dresden, Germany

[4] Helmholtz Zentrum Berlin Materialien Energie GmbH, D-12489 Berlin, Germany

来源：

PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7, NO 2 | 2010年 / 7卷 / 02期

关键词：

POLYELECTROLYTE BRUSHES; FILMS;

D O I：

10.1002/pssc.200982492

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A binary polymer brush consisting of weak polyelectrolytes was investigated with infrared synchrotron mapping ellipsometry in-situ under the influence of different aqueous solutions. Thickness of the brush layer in dry state was similar to 15 nm. The brush, consisting of poly(ethylene glycol) and poly(acrylic acid)-b-poly(styrene) in a 50/50 composition was switched between two different states by changing the pH of the solution. An IR mapping ellipsometer at the IRIS beamline located at the BESSY II synchrotron facility in Berlin, Germany, was used for high lateral resolution in-situ measurements. The results show strong chemical changes in the brush layer due to COOH - COO- conversion of the PAA's carboxylic groups. Measurements with spot sizes of similar to 1 mm on different positions on the samples proved good homogeneity of the brush layer and the qualification of this method for investigation of ultrathin organic films in aqueous solutions in-situ with IR ellipsometry. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：197 / 199

页数：3