Ultrahigh vacuum, variable temperature, dual scanning tunneling microscope system operating under high magnetic field

被引：9

作者：

Cai, Weiwei ^{[1
]}

Pang, Fei ^{[1
]}

Wang, Jian ^{[1
]}

Liu, Hui ^{[1
]}

Liang, X. J. ^{[1
]}

Xue, Q. K. ^{[1
]}

Chen, D. M. ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2007年 / 78卷 / 06期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1063/1.2746821

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a dual scanning tunneling microscope (DSTM) system operating between 2.2 K and room temperature, in a split-coil superconducting magnetic field up to 12 T and in ultrahigh vacuum. The DSTM consists of two compact STMs, each having x, y, and z coarse positioning piezoelectric steppers with embedded capacitive positioning sensor for navigation. Each STM can be operated independently and can achieve atomic resolution. The DSTM and the sample is configured in a way that allows the magnetic field orientation to be varied continuously from normal to parallel to the sample surface. Together with the sample, the DSTM can form a nanometer scale three terminal setup for transport measurement. (c) 2007 American Institute of Physics.

引用

页数：6

共 10 条

[1] Colloquium:: Metallic behavior and related phenomena in two dimensions [J].

Abrahams, E ;

Kravchenko, SV ;

Sarachik, MP .

REVIEWS OF MODERN PHYSICS, 2001, 73 (02) :251-266

[2]

BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[3] Coulomb gap: How a metal film becomes an insulator [J].

Butko, VY ;

DiTusa, JF ;

Adams, PW .

PHYSICAL REVIEW LETTERS, 2000, 84 (07) :1543-1546

[4] Electrical conduction through surface superstructures measured by microscopic four-point probes [J].

Hasegawa, S ;

Shiraki, I ;

Tanabe, F ;

Hobara, R ;

Kanagawa, T ;

Tanikawa, T ;

Matsuda, I ;

Petersen, CL ;

Hansen, TM ;

Boggild, P ;

Grey, F .

SURFACE REVIEW AND LETTERS, 2003, 10 (06) :963-980

[5] VORTEX-CORE STRUCTURE OBSERVED WITH A SCANNING TUNNELING MICROSCOPE [J].

HESS, HF ;

ROBINSON, RB ;

WASZCZAK, JV .

PHYSICAL REVIEW LETTERS, 1990, 64 (22) :2711-2714

[6] Electrical conduction through the surface-state band of the Si(111)-root 21x root 21-(Ag+Au) structure [J].

Jiang, CS ;

Tong, X ;

Hasegawa, S ;

Ino, S .

SURFACE SCIENCE, 1997, 376 (1-3) :69-76

[7] An ultrahigh vacuum dual-tip scanning tunneling microscope operating at 4.2 K [J].

Okamoto, H ;

Chen, DM .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (12) :4398-4403

[8] 3He refrigerator based very low temperature scanning tunneling microscope [J].

Pan, SH ;

Hudson, EW ;

Davis, JC .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (02) :1459-1463

[9] Theory of electrical spin injection: Tunnel contacts as a solution of the conductivity mismatch problem [J].

Rashba, EI .

PHYSICAL REVIEW B, 2000, 62 (24) :R16267-R16270

[10] THEORY OF THE SCANNING TUNNELING MICROSCOPE [J].

TERSOFF, J ;

HAMANN, DR .

PHYSICAL REVIEW B, 1985, 31 (02) :805-813

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