Formation of stable Si network at low Ts by controlling chemical reaction at growing surface

被引:8
|
作者
Shimizu, I [1 ]
机构
[1] Tokyo Inst Technol, Grad Sch, Midori Ku, Yokohama, Kanagawa 227, Japan
关键词
Si network; chemical reaction; silicon thin films;
D O I
10.1016/S0927-0248(00)00165-3
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Recent progress in techniques to prepare stable silicon thin films for solar cells application is reviewed with the aim of controlling chemical reaction at growing surface. For preparing either a-Si:H or solar cells, (1) hydrogen dilution, (2) hot-wire CVD and (3) chemical annealing are discussed with regard to the control of medium-range order structure of Si network related to the stability for light soaking. The issues involved in the individual novel techniques for preparing solar cells are also addressed. Polycrystalline silicon thin films grown at low temperatures as well as the solar cells are introduced by controlling surface chemical reactions. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:127 / 136
页数:10
相关论文
共 50 条
  • [1] STRUCTURAL RELAXATION ON GROWING SURFACE DURING NETWORK FORMATION OF A-SI-H AND A-SIGEX-H BY CHEMICAL ANNEALING
    SHIRAI, H
    NAKAMURA, K
    HANNA, J
    SHIMIZU, I
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1991, 137 : 653 - 656
  • [2] Surface defects formation on strained thin films growing via chemical reaction: a model
    Redkov, A. V.
    Kukushkin, S. A.
    Osipov, A. V.
    2ND INTERNATIONAL SCHOOL AND CONFERENCE SAINT-PETERSBURG OPEN ON OPTOELECTRONICS, PHOTONICS, ENGINEERING AND NANOSTRUCTURES (SPBOPEN2015), 2015, 643
  • [3] Controlling a Chemical Coupling Reaction on a Surface: Tools and Strategies for On-Surface Synthesis
    Clair, Sylvain
    de Oteyza, Dimas G.
    CHEMICAL REVIEWS, 2019, 119 (07) : 4717 - 4776
  • [4] CHEMICAL-REACTION AND SILICIDE FORMATION AT THE PT/SI INTERFACE
    MATZ, R
    PURTELL, RJ
    YOKOTA, Y
    RUBLOFF, GW
    HO, PS
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1984, 2 (02): : 253 - 258
  • [5] Controlling turbulence in a surface chemical reaction by time-delay autosynchronization
    Beta, C
    Bertram, M
    Mikhailov, AS
    Rotermund, HH
    Ertl, G
    PHYSICAL REVIEW E, 2003, 67 (04):
  • [6] Water formation at low temperatures by surface O2 hydrogenation II: the reaction network
    Cuppen, H. M.
    Ioppolo, S.
    Romanzin, C.
    Linnartz, H.
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2010, 12 (38) : 12077 - 12088
  • [7] CHEMICAL SPUTTERING OF SI RELATED TO ROUGHNESS FORMATION OF A CL-PASSIVATED SI SURFACE
    FEIL, H
    DIELEMAN, J
    GARRISON, BJ
    JOURNAL OF APPLIED PHYSICS, 1993, 74 (02) : 1303 - 1309
  • [8] ACETYLENE REACTION WITH THE SI(111) SURFACE - A SEMIEMPIRICAL QUANTUM CHEMICAL STUDY
    WEINER, B
    CARMER, CS
    FRENKLACH, M
    PHYSICAL REVIEW B, 1991, 43 (02): : 1678 - 1684
  • [9] A study on the micro machining of Si wafer using surface chemical reaction
    Park, JM
    Jeong, HD
    ADVANCES IN ABRASIVE TECHNOLOGY VI, 2004, 257-258 : 459 - 464
  • [10] Analysis of radical reaction on growing surface during Si epitaxy by photo-CVD
    Abe, K
    Watahiki, T
    Yamada, A
    Konagai, M
    AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998, 1998, 507 : 423 - 428