A 375x365 high-speed 3-D range finding image sensor using row-parallel search architecture and multisampling technique

被引:33
作者
Oike, Y [1 ]
Ikeda, M [1 ]
Asada, K [1 ]
机构
[1] Univ Tokyo, Tokyo 1138656, Japan
关键词
CMOS image sensor; high range accuracy; high speed; light-section method; multisampling method; range finder; row parallel architecture; 3-D image sensor;
D O I
10.1109/JSSC.2004.841017
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A high-speed three-dimensional (3-D) image sensor for a 1000 range maps/s 3-D measurement system based on a light-section method is presented. It employs a row-parallel search architecture to achieve a high-speed frame access rate for the detection of activated pixels on the focal plane. The row-parallel. search operation is carried out using chained search circuits embedded in a pixel. Moreover, we propose a row-parallel address acquisition technique using a bit-streamed column address flow. Row-parallel processors receive the bit-streamed column address and calculate the center position. of activated pixels. The pipelined operations enable a multisampling technique that improves the resolution of pixel detection. A 375 x 365 3-D image sensor using the present architecture has been designed in a one-poly five-metal 0.18-mum standard CMOS process and successfully tested. It attains a frame access rate of 394.5 kHz with four samplings, which corresponds to 1052 range maps/s. The multisampling operation improves the sub-pixel resolution to around 0.2 pixels and achieves a range accuracy of less than 1.10 mm at a target distance of 600 mm.
引用
收藏
页码:444 / 453
页数:10
相关论文
共 17 条
[1]  
Brajovic V., 2001, 2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177), P256, DOI 10.1109/ISSCC.2001.912630
[2]  
DEBAKKER M, 1998, P EUR SOL STAT CIRC, P208
[3]   INTEGRATED SENSOR AND RANGE-FINDING ANALOG SIGNAL PROCESSOR [J].
GRUSS, A ;
CARLEY, LR ;
KANADE, T .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1991, 26 (03) :184-191
[4]   Novel opportunities for optical level gauging and 3-D-imaging with the photoelectronic mixing device [J].
Gulden, P ;
Vossiek, M ;
Heide, P ;
Schwarte, R .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2002, 51 (04) :679-684
[5]  
JEREMIAS R, 2001, IEEE INT SOL STAT CI, P252
[6]   A binocular CMOS range image sensor with bit-serial block-parallel interface using cyclic pipelined ADC's [J].
Kato, T ;
Kawahito, S ;
Kobayashi, K ;
Sasaki, H ;
Eki, T ;
Hisanaga, T .
2002 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS, 2002, :270-271
[7]  
KAWAKITA M, 2003, P INT BROADC CONV SE, P397
[8]   A 10 000 frames/s CMOS digital pixel sensor [J].
Kleinfelder, S ;
Lim, S ;
Liu, XQ ;
El Gamal, A .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2001, 36 (12) :2049-2059
[9]  
Krymski A., 1999, P S VLSI CIRC JUN, P137
[10]   CCD-based range-finding sensor [J].
Miyagawa, R ;
Kanade, T .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (10) :1648-1652